Model:Micro Crack Inspection
This system uses NIR light source to detect micro crack. Throughput 1 sec/pic. Can be integrated with load/unloading system.

Functions

  • Take time 1 second/piece
  • User friendly
  • Auto load/unload can be integrated
  • Be able to detect diamond cut and slurry cut wafer
  • Solar cell micro crack system is available

 

Specification

  • Machine size:1000 x 1200 x 2000 mm (without loader/sorter)
  • Type:Mono Crystalline/ Multi Crystalline Wafer or Final Cell (by different model)
  • NIR light source
  • InGaAs Camera